Department of Energy Engineering, Nagoya University
Our paper entitled “Effect of Ni Doping on the Electro-optic Property in K(Ta0.6Nb0.4)O3 Films” has been published in Jpn. J. Appl. Phys. We found that a larger withstand electric field was achieved by Ni doping, therefore, the variation of refractive index by the applicable maximum electric field was increased.
Citation: JJAP 61, SN1005 (2022).
Our paper entitled “Optimizing the Growth of K(Ta0.6Nb0.4)O3 Films using Pulsed Laser Deposition and their Electro-optic Property” has been published in J. Ceram. Soc. Jpn. We revealed that the optimized KTN film showed the maximum EO coefficient rc of 42 pm/V, which is larger than the previously reported value for KTN thin films having the same composition.
Citation: JCSJ 130, 424 (2022).
Our paper entitled “Revealing Intrinsic Electro-optic Effect in Single Domain Pb(Zr, Ti)O3 Thin Films” has been published in Appl. Phys. Lett. We revealed the intrinsic EO effect in PZT using the single domain films grown on CaF2 substrates. Our finding shows that the intrinsic EO effect is enhanced in PZT, which is similar to the enhancement seen in the dielectric and piezoelectric constants. Moreover, it tells us that most of the reported EO response in PZT films is supported by additional extrinsic contributions.
Citation: APL 119, 102902 (2021).
Our paper entitled “Influence of Orientation on the Electro-optic Effect in Epitaxial Y-doped HfO2 Ferroelectric Thin Films” has been published in Jpn. J. Appl. Phys. We found that the (111)-Y-HfO2 film showed a larger EO response than that of the (100)-Y-HfO2 film, which is reasonable considering the difference in remnant polarization between the (100)- and (111)-Y-HfO2 films.
Citation: JJAP 60, SFFB13 (2021).
Our paper entitled “Linear Electro-optic Effect in Ferroelectric HfO2-based Epitaxial Thin Films” has been published in Jpn. J. Appl. Phys. Rapid Communication. We found that the Y-HfO2 film showed a linear EO response, owing to its ferroelectricity. The observed results indicate that ferroelectric HfO2-based films are viable candidates for CMOS-compatible EO devices.
Citation: JJAP 60, 070905 (2021).
URL of this web-site was changed from “http://enemat.nucl.nagoya-u.ac.jp/” to “https://enemat.energy.nagoya-u.ac.jp/”.
Prof. Tomoaki YAMADA received the Richard M. Fulrath Award of the American Ceramic Society for his work on Bottom-up Growth Design and Property Control for Dielectric Thin Films and Nanostructures.
Our paper entitled “Enhanced Figure of Merit in Pb(Zr,Ti)O3 Nanorods for Piezoelectric Energy Harvesting” has been published in AIP Adv. We experimentally clarified that the effective figure of merit (FOM) of the PZT nanorod array can be enhanced by the decreased density. This approach enables us to independently control the piezoelectric and dielectric constants of materials, making it possible to lower the effective dielectric constant while maintaining the piezoelectric constant. The results indicate that piezoelectric nanorods are a prospective candidate for small-sized PEHs where the cantilever-based PEH cannot be used at a resonant frequency.
Citation: AIP Adv. 10, 105101 (2020).
Our article entitled “Ferroelectric Nanorods: Control and Application to Piezoelectric Energy Harvesting” has been published in AAPPS Bulletin. We introduced our resent activity on ferroelectric nanorods toward piezoelectric energy harvesting.
Citation: AAPPS Bull. 30, 16-21 (2020).
Our paper entitled “(Pb0.9Sr0.1)TiO3/SrTiO3 Artificial Superlattice Thin Films and Their Electromechanical Response” has been published in J. Ceram. Soc. Jpn. We grew (Pb0.9Sr0.1)TiO3 n/SrTiO3 m artificial superlattice thin films, and investigated their electromechanical response. Synchrotron XRD indicated that the film with n/m = 14/20 had a weak periodicity in the in-plane direction, which may have arisen from the ordered polar vortex arrays existing in the PST layers. All the fabricated superlattice thin films showed the electric field-induced strain, though its magnitude was smaller than that for typical ferroelectric materials.
Citation: J. Ceram. Soc. Jpn. 128, 431-435 (2020).
